Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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* Much higher magnifications possible: Up to 500.000 times on some samples. | * Much higher magnifications possible: Up to 500.000 times on some samples. | ||
* The stage: It allows you to image your sample from almost any angle. | * The stage: It allows you to image your sample from almost any angle. | ||
* Tunability: One can tune the image in a number of ways in order to enhance topography or material contrast | * Tunability: One can tune the image in a number of ways in order to enhance topography or material contrast. | ||
* Elemental analysis: The EDX detector allows you to make detailed investigation of the sample composition. | |||
The SEM is, however, much more complicated in terms of | The SEM is, however, much more complicated in terms of | ||