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Specific Process Knowledge/Lithography/CSAR: Difference between revisions

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|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
|Spin Coater Manual, LabSpin, A-5
|Spin Coater Manual, LabSpin, A-5
|60 sec at various spin speed. Acceleration 4000 s-2, softbake 5 min at 150 deg Celcius
|60 sec at various spin speed.
Acceleration 4000 s-2,  
softbake 5 min at 150 deg Celcius
|Resist poured directly from bottle
|Resist poured directly from bottle
|TIGRE, 09-04-2014
|TIGRE, 09-04-2014
Line 52: Line 54:
|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
|JEOL 9500 E-beam writer, E-1
|JEOL 9500 E-beam writer, E-1
|Dosepattern 14nm - 100nm, dose 120-280 muC/cm2
|Dosepattern 14nm - 100nm,  
dose 120-280 muC/cm2
|Virtual chip mark height detection
|Virtual chip mark height detection
| TIGRE, 10-04-2014
| TIGRE, 10-04-2014
Line 65: Line 68:
|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
|Fumehood, D-3
|Fumehood, D-3
|60 sec in X AR 600-54/6, 60 sec rinse in IPA, N2 Blow dry
|60 sec in X AR 600-54/6,  
60 sec rinse in IPA,  
N2 Blow dry
|Agitation (by hand) while developing
|Agitation (by hand) while developing
| TIGRE, 10-04-2014
| TIGRE, 10-04-2014