Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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The list of instruments for sample imaging available at Danchip includes a number of [[Specific Process Knowledge/Characterization/Optical microscope|optical microscopes]] , three [[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|scanning electron microscopes (SEM's) | The list of instruments for sample imaging available at Danchip includes a number of [[Specific Process Knowledge/Characterization/Optical microscope|optical microscopes]] , three [[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|scanning electron microscopes]] (SEM's) and an [[Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy|atomic force microscope]] (AFM). | ||
Revision as of 16:58, 21 January 2008
The list of instruments for sample imaging available at Danchip includes a number of optical microscopes , three scanning electron microscopes (SEM's) and an atomic force microscope (AFM).
| Optical microscopes | SEM | AFM | Profiler | |
|---|---|---|---|---|
| Magnification range | ||||
| Depth of focus |