Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
Appearance
No edit summary |
No edit summary |
||
| Line 1: | Line 1: | ||
The list of instruments for sample imaging available at Danchip includes a number of [[ | The list of instruments for sample imaging available at Danchip includes a number of [[Specific Process Knowledge/Characterization/Optical microscope|optical microscopes]] , three | ||
[[ | [[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|scanning electron microscopes (SEM)]] | ||