Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions

Revision as of 16:41, 21 January 2008

The list of instruments for sample imaging available at Danchip includes a number of optical microscopes, three scanning electron microscopes (SEM) and a atomic force microscopy.

	Optical microscopes	SEM	AFM	Profiler
Magnification range
Depth of focus

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-The list of instruments for sample imaging available at Danchip includes a number of optical microscopes, an AFM and three SEM's.
+The list of instruments for sample imaging available at Danchip includes a number of optical microscopes, three scanning electron microscopes (SEM) and a atomic force microscopy.
-In one end is the very basic photograph of a sample or wafer that may be taken with the digital camera using the great macro functionality (Ask a Danchip employee to borrow it). In the other is the very advanced [[Specific Process Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/FEI|FEI SEM]] that is capable of taking high magnification images of any sample or wafer.
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 !Profiler
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-| Magnification
+| Magnification range
 |
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