Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions
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*[[/FEI|The FEI SEM]] | *[[/FEI|The FEI SEM]] | ||
*[[/Jeol|The Jeol SEM]] | *[[/Jeol|The Jeol SEM]] | ||
== Common challenges in scanning electron microscopy == | |||
*[[/samplemount| Sample mounting]] | |||
*[[/imageoptmisation| Image optimisation]] | |||
*[[/samplecharging| Problems related to sample charging]] | |||
==Equipment performance and process related parameters== | ==Equipment performance and process related parameters== | ||