Specific Process Knowledge/Thermal Process/Oxidation: Difference between revisions
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!Substrate and Batch size | !Substrate and Batch size | ||
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*1-30 50 mm wafers | |||
*1-30 100 mm wafers | |||
* | Including one test wafer | ||
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*1-30 50 mm wafers | |||
*1-30 100 mm wafers | |||
* | Including one test wafer | ||
| | | | ||
*1-30 50 mm wafers | |||
*1-30 100 mm wafers | |||
* | Including one test wafer | ||
| | | | ||
*1-30 50 mm wafers | |||
*1-30 100 mm wafers | |||
* | *1-30 150 mm wafers | ||
* | Including one test wafer | ||
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*Small samples on carrier wafer, horizontal | |||
* | *1-30 50 mm wafers | ||
* | *1-30 100 mm wafers | ||
Including one test wafer | |||
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*1-150 100 mm wafers | |||
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*Small samples on carrier wafer, horizontal | |||
* | *1-25 50 mm wafers | ||
* | *1-25 100 mm wafers, vertical and horizontal | ||
* | |||
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