Specific Process Knowledge/Etch/RIE (Reactive Ion Etch): Difference between revisions
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!style="background:silver; color:black;" align="center" width="60"|Purpose | !style="background:silver; color:black;" align="center" width="60"|Purpose | ||
|style="background:LightGrey; color:black"|Dry etch of | |style="background:LightGrey; color:black"|Dry etch of | ||
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*Silicon | *Silicon | ||
*Silicon oxide | *Silicon oxide | ||
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!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Performance | !style="background:silver; color:black" align="center" valign="center" rowspan="2"|Performance | ||
|style="background:LightGrey; color:black"|Etch rates | |style="background:LightGrey; color:black"|Etch rates | ||
|style="background:WhiteSmoke; color: | |style="background:WhiteSmoke; color:silver"| | ||
*Silicon: ~0.04-0.8 µm/min | *Silicon: ~0.04-0.8 µm/min | ||
*Silicon oxide: ~0.02-0.15 µm/min | *Silicon oxide: ~0.02-0.15 µm/min | ||
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|style="background:LightGrey; color:black"|Anisotropy | |style="background:LightGrey; color:black"|Anisotropy | ||
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*Can vary from isotropic to anisotropic with vertical | *Can vary from isotropic to anisotropic with vertical | ||
:sidewalls and on to a physical etch where the sidewalls | :sidewalls and on to a physical etch where the sidewalls | ||
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!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Process parameter range | !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Process parameter range | ||
|style="background:LightGrey; color:black"|Max pressure | |style="background:LightGrey; color:black"|Max pressure | ||
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*800 mTorr | *800 mTorr | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
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|style="background:LightGrey; color:black"|Max R.F. power | |style="background:LightGrey; color:black"|Max R.F. power | ||
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*600 W | *600 W | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
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|style="background:LightGrey; color:black"|Gas flows | |style="background:LightGrey; color:black"|Gas flows | ||
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*SF<sub>6</sub>: 0-52 sccm | *SF<sub>6</sub>: 0-52 sccm | ||
*O<sub>2</sub>: 0-99 sccm | *O<sub>2</sub>: 0-99 sccm | ||
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!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates | !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates | ||
|style="background:LightGrey; color:black"|Batch size | |style="background:LightGrey; color:black"|Batch size | ||
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*1 4" wafer | *1 4" wafer | ||
*1 2" wafer (use Al carrier with Si dummy wafer) | *1 2" wafer (use Al carrier with Si dummy wafer) | ||
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| style="background:LightGrey; color:black"|Allowed materials | | style="background:LightGrey; color:black"|Allowed materials | ||
|style="background:WhiteSmoke; color: | |style="background:WhiteSmoke; color:silver"| | ||
*Silicon | *Silicon | ||
*Silicon oxide (with boron, phosphorous and germanium) | *Silicon oxide (with boron, phosphorous and germanium) |
Revision as of 11:07, 28 February 2014
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Etching using the dry etch technique RIE (Reactive Ion Etch)
At Danchip we have now two RIE's. RIE2 for etching silicon based materials, resist and polymers and one (III-V RIE) for etching III-V materials. Here only RIE2 will be described.
In RIE2 it is allowed to have small amounts of metals exposed to the plasma.
The user manuals, quality control procedures and results, user APVs, technical information and contact information can be found in LabManager:
Process information
- Etch of silicon using RIE
- Etch of silicon oxide using RIE
- Etch of silicon nitride using RIE
- Etch of photo resist using RIE
Equipment | RIE1 - HAS BEEN DECOMMISSIONED | RIE2 | |
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Purpose | Dry etch of |
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Performance | Etch rates |
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Anisotropy |
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Process parameter range | Max pressure |
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Max R.F. power |
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Gas flows |
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Substrates | Batch size |
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Allowed materials |
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