Specific Process Knowledge/Thin film deposition/Furnace LPCVD PolySilicon: Difference between revisions
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!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment | !colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment | ||
|style="background:WhiteSmoke; color:black"|<b>4" LPCVD polysilicon furnace ( | |style="background:WhiteSmoke; color:black"|<b>4" LPCVD polysilicon furnace (B4)</b> | ||
|style="background:WhiteSmoke; color:black"|<b>6" LPCVD polysilicon furnace (E2)</b> | |style="background:WhiteSmoke; color:black"|<b>6" LPCVD polysilicon furnace (E2)</b> | ||
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*Amorphous polySi | *Amorphous polySi | ||
*Boron doped polySi (B<sub>2</sub>H<sub>6</sub> dopant) | *Boron doped polySi (B<sub>2</sub>H<sub>6</sub> dopant) | ||
*Phosphorus doped polySi | *Phosphorus doped polySi (PH<sub>3</sub> dopant) | ||
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*Standard polySi | *Standard polySi | ||
*Amorphous polySi | *Amorphous polySi | ||
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*150-220 mTorr | *150-220 mTorr | ||
The process pressure depends on the | The process pressure depends on the process | ||
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|style="background:LightGrey; color:black"|Gas flows | |style="background:LightGrey; color:black"|Gas flows | ||
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*B<sub>2</sub>H<sub>6</sub>: 7 sccm | *B<sub>2</sub>H<sub>6</sub>: 7 sccm | ||
*PH<sub>3</sub>: 7 sccm | *PH<sub>3</sub>: 7 sccm | ||
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*SiH<sub>4</sub>: 50-70 sccm | *SiH<sub>4</sub>: 50-70 sccm | ||
*BCl<sub> | *BCl<sub>3</sub>: 1 sccm | ||
The silane (SiH<sub>4</sub>) flow depends on the process | |||
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!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Substrates | !style="background:silver; color:black" align="center" valign="center" rowspan="2"|Substrates | ||
|style="background:LightGrey; color:black"|Batch size | |style="background:LightGrey; color:black"|Batch size | ||
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*1- | *1-30 100 mm wafers | ||
Including a testwafer with ~110 nm oxide | Including a testwafer with ~110 nm oxide | ||
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*1-25 | *1-25 or 1-50 100 mm wafers | ||
*1-25 | *1-25 or 1-50 150 mm wafers | ||
Including a testwafer with ~110 nm oxide | Including a testwafer with ~110 nm oxide | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||