Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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Danchip has an extensive list of equipments for sample imaging. In one end is the very basic photograph of a sample or wafer that may be taken with the digital camera using the great macro functionality (Ask a Danchip employee to borrow it). In the other is the very advanced [[Characterization/SEM:_Scanning_Electron_Microscopy/FEI|FEI SEM]] that is capable of taking high magnification images of any sample or wafer. | Danchip has an extensive list of equipments for sample imaging. In one end is the very basic photograph of a sample or wafer that may be taken with the digital camera using the great macro functionality (Ask a Danchip employee to borrow it). In the other is the very advanced [[Specific Process Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/FEI|FEI SEM]] that is capable of taking high magnification images of any sample or wafer. | ||
Revision as of 16:56, 10 January 2008
Danchip has an extensive list of equipments for sample imaging. In one end is the very basic photograph of a sample or wafer that may be taken with the digital camera using the great macro functionality (Ask a Danchip employee to borrow it). In the other is the very advanced FEI SEM that is capable of taking high magnification images of any sample or wafer.