Specific Process Knowledge/Characterization/Drop Shape Analyzer: Difference between revisions
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|style="background:LightGrey; color:black"|Substrate size | |style="background:LightGrey; color:black"|Substrate size | ||
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*Up to 6" wafers. In order to measure a few square mm's of flat surface | *Up to 6" wafers. In order to measure a few square mm's of flat surface is required. | ||
is required. | |||
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|style="background:silver; color:black"| | |style="background:silver; color:black"| | ||