Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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==Process Information== | ==Process Information== | ||
[[Image:Tap300Al-G.jpg|right|thumb|Std. tip Tap300Al-G]] | |||
[[Image:Tap300Al-G-schematic.png|right|thumb|Std. tip Tap300Al-G]] | |||
[[Image:SSS-NCHR-AFM-tip.jpg|right|thumb|SSS-NCHR tip<br /> (Super-Sharp-Silicon)]] | |||
[[Image:Nanoman cantilever AR5.jpg|right|thumb|AR5-NCHR tip<br /> (Aspect ratio 5)]] | |||
For a tutorial on AFM see here: [http://www.doitpoms.ac.uk/tlplib/afm/index.php AFM] | For a tutorial on AFM see here: [http://www.doitpoms.ac.uk/tlplib/afm/index.php AFM] | ||
Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion] | Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion] | ||
==An overview of the performance of the AFM: Nanoman== | ==An overview of the performance of the AFM: Nanoman== | ||
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