Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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[[Image:Tap300Al-G-schematic.png|right|thumb|Std. tip Tap300Al-G]] | [[Image:Tap300Al-G-schematic.png|right|thumb|Std. tip Tap300Al-G]] | ||
[[Image:SSS-NCHR-AFM-tip.jpg|right|thumb|SSS-NCHR tip<br /> (Super-Sharp-Silicon)]] | [[Image:SSS-NCHR-AFM-tip.jpg|right|thumb|SSS-NCHR tip<br /> (Super-Sharp-Silicon)]] | ||
{| border="2" cellspacing="0" cellpadding=" | {| border="2" cellspacing="0" cellpadding="2" | ||
!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment | |||
|style="background:WhiteSmoke; color:black"|<b>Nanoman</b> | |||
|- | |- | ||
!style="background:silver; color:black;" align="left"|Purpose | !style="background:silver; color:black;" align="left"|Purpose | ||