Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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[[image:Nanoman.jpg|275x275px|right|thumb|Nanoman: positioned in cleanroom 4 - glass cage no. 4]] | [[image:Nanoman.jpg|275x275px|right|thumb|Nanoman: positioned in cleanroom 4 - glass cage no. 4]] | ||
The AFM: Nanoman is a product of Veeco Instruments. | The AFM: Nanoman is a product of Veeco Instruments. AFM stands for Atomic Force Microscope which is a scanning probe microscope where a sharp probe is scanned across a surface either in contact mode or tapping mode. The outcome is a topographic plot of the surface. It has a lateral solution at about 1 nm and a vertical resolution of less than 1 Å which makes it very suitable for topographic characterization in the nanometer regime. The limiting factor however is often the size of the probe in use. The | ||
To get some product information from the vendor take a look at Veeco's homepage [http://www.veeco.com/products/details.php?cat=1&sub=1&pid=178] | To get some product information from the vendor take a look at Veeco's homepage [http://www.veeco.com/products/details.php?cat=1&sub=1&pid=178] | ||