Specific Process Knowledge/Bonding: Difference between revisions

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|'''Bonding temperature'''
|'''Bonding temperature'''
|Depending on the eutecticum 310<math>^o</math>C to 400<math>^o</math>C.
|Depending on the eutecticum 310°C  to 400°C .
|Depending on defects 50<math>^o</math>C to 400<math>^o</math>C.
|Depending on defects 50°C  to 400°C .
|Depending on the voltage 300<math>^o</math>C to 500<math>^o</math>C Standard is 400<math>^o</math>C.
|Depending on the voltage 300°C to 500°C  Standard is 400°C .
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|'''Annnealing temperature'''
|'''Annnealing temperature'''
|No annealing
|No annealing
|1000<math>^o</math>C in the bond furnace C3  
|1000°C  in the bond furnace C3  
|No annealing
|No annealing
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Revision as of 12:36, 25 November 2013

Choose bonding method

Comparing the three bonding methods in the EVG NIL

. Eutectic bonding Fusion bonding Anodic bonding
General description For bonding two substrates by use of an interphase that makes an eutecticum. For bonding two identical materials. For bonding Si and Glass.
Bonding temperature Depending on the eutecticum 310°C to 400°C . Depending on defects 50°C to 400°C . Depending on the voltage 300°C to 500°C Standard is 400°C .
Annnealing temperature No annealing 1000°C in the bond furnace C3 No annealing
Materials possible to bond Bonding of substrates is done by use of the eutectica Au/Si, Au/Sn and Au/Sn/Ni Si/Si, SiO/SiO Si/Pyrex (glass)
Substrate size Up to 6" (aligning only possible for 4" and 6") Up to 6" (aligning only possible for 4" and 6") Up to 6" (aligning only possible for 4" and 6")
Cleaning Cleaning by N2. Wet chemical cleaning, IMEC. Cleaning by N2.
IR alignment Double side polished wafers. Double side polished wafers. Not relevant.

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