Specific Process Knowledge/Bonding: Difference between revisions
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|'''Bonding temperature''' | |'''Bonding temperature''' | ||
|Depending on the eutecticum | |Depending on the eutecticum 310°C to 400°C . | ||
|Depending on defects | |Depending on defects 50°C to 400°C . | ||
|Depending on the voltage | |Depending on the voltage 300°C to 500°C Standard is 400°C . | ||
|-valign="top" | |-valign="top" | ||
|'''Annnealing temperature''' | |'''Annnealing temperature''' | ||
|No annealing | |No annealing | ||
| | |1000°C in the bond furnace C3 | ||
|No annealing | |No annealing | ||
|-valign="top" | |-valign="top" |
Revision as of 12:36, 25 November 2013
Choose bonding method
Comparing the three bonding methods in the EVG NIL
. | Eutectic bonding | Fusion bonding | Anodic bonding |
---|---|---|---|
General description | For bonding two substrates by use of an interphase that makes an eutecticum. | For bonding two identical materials. | For bonding Si and Glass. |
Bonding temperature | Depending on the eutecticum 310°C to 400°C . | Depending on defects 50°C to 400°C . | Depending on the voltage 300°C to 500°C Standard is 400°C . |
Annnealing temperature | No annealing | 1000°C in the bond furnace C3 | No annealing |
Materials possible to bond | Bonding of substrates is done by use of the eutectica Au/Si, Au/Sn and Au/Sn/Ni | Si/Si, SiO/SiO | Si/Pyrex (glass) |
Substrate size | Up to 6" (aligning only possible for 4" and 6") | Up to 6" (aligning only possible for 4" and 6") | Up to 6" (aligning only possible for 4" and 6") |
Cleaning | Cleaning by N2. | Wet chemical cleaning, IMEC. | Cleaning by N2. |
IR alignment | Double side polished wafers. | Double side polished wafers. | Not relevant. |