Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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|Stylus profiler | |Stylus profiler | ||
(Dektak 8, Dektak XTA) | (Dektak 8, Dektak XTA) | ||
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!Operation priciple | |||
|Optical | |||
|Optical | |||
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|Measurements of | |||
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*Graphene and carbon nanotubes | *Graphene and carbon nanotubes | ||
:(Only FEI, use special sample holder) | :(Only FEI, use special sample holder) | ||
*Non-conducting samples | |||
:(Use low vacuum detector in SEM-FEI or VPSE detector in SEM-Zeiss) | |||
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*All sample materials, except samples that might stick to the tip. | *All sample materials, except samples that might stick to the tip. | ||