Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
| Line 7: | Line 7: | ||
== Sample imaging == | == Sample imaging == | ||
A Danchip a number of instruments are available for sample imaging, including | A Danchip a number of instruments are available for sample imaging, including several optical microscopes, and optical profiler, a number of SEMs (scanning electron microscopes), an AFM (atomic force microscope) and two stylus profilers (Dektak). These intruments cover a wide range of | ||
The optical microscopes provide fast and easy information about most samples without sample preparation. The resolution is limited by the objectives and wavelenght of the light. Also the depth of focus is limited, especially for higher magnifications. | |||
(atomic force microscope) and two stylus profilers (Dektak). These instruments cover wide range of applications. | |||
Optical micrscope... | Optical micrscope... | ||