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Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300/IBE Au etch: Difference between revisions

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!SEM images of the etch profile (click to view a larger image)
!SEM images of the etch profile (click to view a larger image)
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<gallery widths="150px" heights="150px" perrow="2">  
<gallery caption="600nm lines etched for 14 min (15-12-2011)" widths="150px" heights="150px" perrow="2">  
image:IBE_Au_Ti_nr13_1.jpg|several 600nm line profiles through Ti and Au.  
image:IBE_Au_Ti_nr13_1.jpg|Several line profiles through Ti and Au.  
image:IBE_Au_Ti_nr13_2.jpg|600nm line profile through Ti and Au.
image:IBE_Au_Ti_nr13_2.jpg|Line profile through Ti and Au.
</gallery>  
</gallery>  
<gallery widths="150px" heights="150px" perrow="3">  
<gallery widths="150px" heights="150px" perrow="3">  
image:IBE_Au_Ti_uden_Ti_nr13_1.jpg|several 600nm line profiles in Au after Ti has been removed.  
image:IBE_Au_Ti_uden_Ti_nr13_1.jpg|Several line profiles in Au after Ti has been removed.  
image:IBE_Au_Ti_uden_Ti_nr13_2.jpg|600nm line profile in Au after Ti has been removed.
image:IBE_Au_Ti_uden_Ti_nr13_2.jpg|Line profile in Au after Ti has been removed.
image:IBE_Au_Ti_uden_Ti_nr13_3.jpg|600nm line in Au after Ti has been removed. Sample is tilted
image:IBE_Au_Ti_uden_Ti_nr13_3.jpg|Line in Au after Ti has been removed. Sample is tilted
</gallery>  
</gallery>  
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