Specific Process Knowledge/Etch/DRIE-Pegasus: Difference between revisions
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*[[Specific Process Knowledge/Etch/DRIE-Pegasus/nanoetch|Nanoetch]] | *[[Specific Process Knowledge/Etch/DRIE-Pegasus/nanoetch|Nanoetch]] | ||
*[[Specific Process Knowledge/Etch/DRIE-Pegasus/slopedsidewalls|Etches that produce positively sloped sidewalls for imprinting purposes]] | <!-- *[[Specific Process Knowledge/Etch/DRIE-Pegasus/slopedsidewalls|Etches that produce positively sloped sidewalls for imprinting purposes]] --> | ||
*[[Specific Process Knowledge/Etch/DRIE-Pegasus/Waferthinning| Maskless reduction of wafer thicknesses]] | <!-- *[[Specific Process Knowledge/Etch/DRIE-Pegasus/Waferthinning| Maskless reduction of wafer thicknesses]] --> | ||
<!-- *[[Specific Process Knowledge/Etch/DRIE-Pegasus/VeeryDeeep| Very deep etching]] --> | |||
==Equipment performance and process related parameters== | ==Equipment performance and process related parameters== | ||