Specific Process Knowledge/Characterization/Optical characterization: Difference between revisions

@@ Line 69: / Line 69: @@
 |style="background:LightGrey; color:black"|Batch size
 |style="background:WhiteSmoke; color:black"|
-*<nowiki>#</nowiki> small samples
+*One sample at a time smaller than 150mm (ask if you have anything larger)
-*<nowiki>#</nowiki> 50 mm wafers
-*<nowiki>#</nowiki> 100 mm wafers
-*<nowiki>#</nowiki> 150 mm wafers
 |style="background:WhiteSmoke; color:black"|
-*<nowiki>#</nowiki> small samples
+*One sample at a time, anythng that goes in the Sputter Sustem Lesker
-*<nowiki>#</nowiki> 50 mm wafers
-*<nowiki>#</nowiki> 100 mm wafers
-*<nowiki>#</nowiki> 150 mm wafers
 |-
 | style="background:LightGrey; color:black"|Allowed materials