Specific Process Knowledge/Thin film deposition/Deposition of Scandium Nitride/ScN Reactive Sputtering in Cluster Lesker PC3: Difference between revisions
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|<b>150W, 3mTorr, | |<b>150W, 3mTorr, 1000s</b> | ||
|0.63 | |0.63 | ||
|0.67 | |0.67 | ||
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|<b>150W, 3mTorr, | |<b>150W, 3mTorr, 1000s</b> | ||
|1.29 | |1.29 | ||
|1.17 | |1.17 | ||
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==X-ray Photoelectron Spectroscopy== | ==X-ray Photoelectron Spectroscopy== | ||