Specific Process Knowledge/Thermal Process/Storage and cleaning of wafer to the A, B, C and E stack furnaces: Difference between revisions
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==RCA cleaning of wafers for the A, B, C and E stack furnaces== | ==RCA cleaning of wafers for the A, B, C and E stack furnaces== | ||
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====C4 furnace:==== | ====C4 furnace:==== | ||
*For annealing of wafers and wafer pieces with Al, Al2O3 and TiO2. The samples cannot be RCA cleaned. | *For annealing of wafers and wafer pieces with Al, Al2O3 and TiO2. The samples cannot be RCA cleaned. | ||
====E1 furnace:==== | |||
*New silicon wafers can go directly into the furnace. | |||
*Other processed wafers and new quartz wafers have to be RCA cleaned. The wafers can be cleaned the day before they are going into the furnace. | |||