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Specific Process Knowledge/Thin film deposition/Cluster-based multi-chamber high vacuum sputtering deposition system: Difference between revisions

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== Sputter-System Metal-Nitride (PC3) ==
== Sputter-System Metal-Nitride (PC3) ==


The second process chamber called PC3 consists of two KJLC Torus® 3" magnetron sputtering sources and one height adjustable KJLC Torus® 4" magnetron sputtering source, also with possibility of RF, DC, Pulse DC and HIPIMS sputtering. The chamber has a possibility to do the RF bias on a substrate, which can be used as substrate cleaning before the deposition or used during the deposition to alter the film properties.  
The second process chamber called PC3 consists of two KJLC Torus® 3" magnetron sputtering sources and one height adjustable KJLC Torus® 4" magnetron sputtering source, also with possibility of RF, DC, Pulse DC and HIPIMS sputtering. The chamber has a possibility to do the RF bias on a substrate, which can be used as substrate cleaning before the deposition or used during the deposition to alter the film properties. It is possible to do the co-sputtering (sputtering of two or more sources at the same time) as long as the sources are not sharing the same power supply.  


<gallery caption="Deposition rates of HfO2 at different temperaturs. ALD window." widths="600px" heights="600px" perrow="2">
<gallery caption="Process chamber PC 3" widths="600px" heights="600px" perrow="2">
image:PC3_photo.png| Deposition rate of HfO<sub>2</sub> at 150 <sup>o</sup>C. Substrate: Silicon 6" wafer with native oxide.
image:PC3_photo.png| Photography of the chamber.
image:PC3_during_sputtering.png| Deposition rate of HfO<sub>2</sub> at 150 <sup>o</sup>C. Substrate: Silicon 6" wafer with native oxide.
image:PC3_during_sputtering.png| Deposition from source 2.
</gallery>
</gallery>