Specific Process Knowledge/Thin film deposition/Deposition of Silicon Nitride/Deposition of Silicon Nitride using PECVD: Difference between revisions
Appearance
No edit summary |
|||
| Line 6: | Line 6: | ||
== Deposition of SiN with PECVD4 == | == Deposition of SiN with PECVD4 == | ||
{| border="1" cellspacing="2" cellpadding="2" colspan="3" | {| border="1" cellspacing="2" cellpadding="2" colspan="3" | ||
|bgcolor="#98FB98" |'''Quality | |bgcolor="#98FB98" |'''Quality Control (QC) for PECVD4 [[Image:section under construction.jpg|70px]] ''' | ||
|- | |- | ||
| | | | ||
*[http://labmanager | *[http://labmanager.dtu.dk/d4Show.php?id=1402&mach=395 The QC procedure for PECVD4]<br> | ||
*[http://www.labmanager.dtu.dk/view_binary.php?type=data&mach=106 The newest QC data for PECVD3]<br> | *[http://www.labmanager.dtu.dk/view_binary.php?type=data&mach=106 The newest QC data for PECVD3]<br> | ||
{| {{table}} | {| {{table}} | ||
| Line 40: | Line 40: | ||
!PECVD4 | !PECVD4 | ||
|- | |- | ||
| | |Deposition rate | ||
|~ 11.6 nm/min | |~ 11.6 nm/min | ||
|- | |- | ||