LabAdviser/Technology Research/Nanoscale characterization of ultra-thin metal films for nanofabrication applications: Difference between revisions
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*: [https://www.sciencedirect.com/science/article/pii/S1044580318300937 Link to Article] | *: [https://www.sciencedirect.com/science/article/pii/S1044580318300937 Link to Article] | ||
*: A. B. da Silva Fanta, <u>M. Todeschini</u>, A. Burrows, H. Jansen, C. D. Damsgaard, H. Alimadadi, and J. B. Wagner<br> ''Materials Characterization'', vol. 139, pp. 452-462, 2018. | *: A. B. da Silva Fanta, <u>M. Todeschini</u>, A. Burrows, H. Jansen, C. D. Damsgaard, H. Alimadadi, and J. B. Wagner<br> ''Materials Characterization'', vol. 139, pp. 452-462, 2018. | ||
** '''Overview:''' [[/Transmission Kikuchi diffraction|Transmission Kikuchi diffraction]] | ** '''Overview:''' [[LabAdviser/CEN/Nova NanoSEM 600/Transmission Kikuchi diffraction|Transmission Kikuchi diffraction]] | ||