LabAdviser/Technology Research/Nanoscale characterization of ultra-thin metal films for nanofabrication applications: Difference between revisions
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*; Complementary electron microscopic-spectroscopic characterization of Ti and Cr adhesion layers | *; Complementary electron microscopic-spectroscopic characterization of Ti and Cr adhesion layers | ||
*: <u>M. Todeschini</u>, A. B. da Silva Fanta, J. B. Wagner, F. Jensen, A. Han<br> Abstract and Poster at ''43rd International conference on Micro and Nano Engineering'', Braga, Portugal, 2017. | *: <u>M. Todeschini</u>, A. B. da Silva Fanta, J. B. Wagner, F. Jensen, A. Han<br> Abstract and Poster at ''43rd International conference on Micro and Nano Engineering'', Braga, Portugal, 2017. | ||
*; Electron Microscopy Characterization of Adhesion Layer Influence on Ultra-thin Gold Films | *; Electron Microscopy Characterization of Adhesion Layer Influence on Ultra-thin Gold Films | ||