Specific Process Knowledge/Thin film deposition/Deposition of Copper: Difference between revisions

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* 4x6" wafers or  
* 4x6" wafers or  
* 4x4" wafers or  
* 12x4" wafers or  
* 4x2" wafers  
* 12x2" wafers  
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!Layer thickness
!Layer thickness
|10Å to 0.5µm  
|10Å to 0.5µm*
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10Å to 1µm  
10Å to 1µm*


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Depending on [[Specific Process Knowledge/Thin film deposition/Multisource PVD/Cu|process parameters]]
Depending on [[Specific Process Knowledge/Thin film deposition/Multisource PVD/Cu|process parameters]]
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* Silicon
* Silicon oxide
* Silicon (oxy)nitride
* Photoresist
* PMMA
* Mylar
* SU-8
* Metals
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* Silicon
* Silicon oxide
* Silicon (oxy)nitride
* Photoresist
* PMMA
* Mylar
* SU-8
* Metals
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'''*''' ''To deposit layers thicker then 200 nm permission is required (contact Thin film group)''


== Studies of Cu deposition processes ==
== Studies of Cu deposition processes ==

Revision as of 08:45, 7 March 2014

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Deposition of Cu

Copper can be deposited by e-beam evaporation or sputtering . In the chart below you can compare the different deposition equipment.


E-beam evaporation (Alcatel) Sputter deposition (PVD co-sputter/evaporation)
Batch size
  • Up to 1x4" wafers
  • smaller pieces
  • 4x6" wafers or
  • 12x4" wafers or
  • 12x2" wafers
Pre-clean RF Ar clean RF Ar clean
Layer thickness 10Å to 0.5µm*

10Å to 1µm*

Deposition rate 2Å/s to 15Å/s

Depending on process parameters

Allowed materials
  • Silicon
  • Silicon oxide
  • Silicon (oxy)nitride
  • Photoresist
  • PMMA
  • Mylar
  • SU-8
  • Metals
  • Silicon
  • Silicon oxide
  • Silicon (oxy)nitride
  • Photoresist
  • PMMA
  • Mylar
  • SU-8
  • Metals
Comment

* To deposit layers thicker then 200 nm permission is required (contact Thin film group)


Studies of Cu deposition processes

Roughness of Cu layers - Roughness of Cu layers deposited with Alcatel


Cu sputtering in (PVD co-sputter/evaporation)

Process parameters are listed here: Cu sputter in PVD co-sputter/evaporation