Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
| Line 44: | Line 44: | ||
(Sensofar) | (Sensofar) | ||
|Scanning electron microscope | |Scanning electron microscope | ||
(Zeiss, LEO, FEI, JEOL) | ([[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/Zeiss|Zeiss]], [[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/LEO|LEO]], [[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/FEI|FEI]], [[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/Jeol|JEOL]]) | ||
|Atomic force microscope | |Atomic force microscope | ||
(NanoMan) | (NanoMan) | ||