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Specific Process Knowledge/Etch/DRIE-Pegasus/processB: Difference between revisions

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=== Results ===
=== Results ===


A number of wafers are patterned with the [[Specific Process Knowledge/Photolithography/masks/travka|travka masks]].
A number of wafers are patterned with the [[Specific Process Knowledge/Photolithography/masks/travka|travka masks]] in 4 microns of AZ photoresist. The wafers are then etc
 
{| border="2" cellpadding="2" cellspacing="1"
|-
! Wafer number
! Mask
! Process B duration
|-
| 1
| Travka 05
| 17 cycles or 3:07 mins
|-
| 2
| Travka 05
| 34 cycles or 6:14 mins
|-
| 4
| Travka 10
| 17 cycles or 3:07 mins
|-
| 5
| Travka 10
| 34 cycles or 6:14 mins
|-
| 7
| Travka 20
| 17 cycles or 3:07 mins
|-
| 8
| Travka 20
| 34 cycles or 6:14 mins
|-
| 10
| Travka 10
| 17 cycles or 3:07 mins
|-
| 5
| Travka 10
| 34 cycles or 6:14 mins
 
|}