Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions
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!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment | !colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment | ||
|style="background:WhiteSmoke; color:black"|[[/Leo|Leo SEM]] | |style="background:WhiteSmoke; color:black" align="center"|[[/Leo|Leo SEM]] | ||
|style="background:WhiteSmoke; color:black"|[[/Zeiss|Zeiss SEM]] | |style="background:WhiteSmoke; color:black" align="center"|[[/Zeiss|Zeiss SEM]] | ||
|style="background:WhiteSmoke; color:black"|[[/FEI|FEI SEM]] | |style="background:WhiteSmoke; color:black" align="center"|[[/FEI|FEI SEM]] | ||
|style="background:WhiteSmoke; color:black"|[[/Jeol|Jeol SEM]] | |style="background:WhiteSmoke; color:black" align="center"|[[/Jeol|Jeol SEM]] | ||
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!colspan="2" border="none" style="background:silver; color:black;" align="center"|Model | !colspan="2" border="none" style="background:silver; color:black;" align="center"|Model | ||
|style="background:WhiteSmoke; color:black"| Leo 1550 SEM | |style="background:WhiteSmoke; color:black" align="center"| Leo 1550 SEM | ||
|style="background:WhiteSmoke; color:black"| Zeiss Supra 40 VP | |style="background:WhiteSmoke; color:black" align="center"| Zeiss Supra 40 VP | ||
|style="background:WhiteSmoke; color:black"| FEI Nova 600 NanoSEM | |style="background:WhiteSmoke; color:black" align="center"| FEI Nova 600 NanoSEM | ||
|style="background:WhiteSmoke; color:black"| Jeol JSM 5500 LV | |style="background:WhiteSmoke; color:black" align="center"| Jeol JSM 5500 LV | ||
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!style="background:silver; color:black;" align="center" width="60"|Purpose | !style="background:silver; color:black;" align="center" width="60"|Purpose | ||