Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions

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At the moment we have three SEM's. Together they cover a wide range of needs in the cleanroom: From the fast in-process verification of different process parameters such as etch rates, step coverages or lift-off quality to the ultra high resolution images on any type of sample intended for publication.
At the moment we have three SEM's. Together they cover a wide range of needs in the cleanroom: From the fast in-process verification of different process parameters such as etch rates, step coverages or lift-off quality to the ultra high resolution images on any type of sample intended for publication.


The SEM that will cover most users needs is the [[/Leo|Leo SEM]]. It is a very reliable and rugged field emission instrument that provides high quality images of most samples. Due to its robustness new users only need a mandatory two hour training session
The SEM that will cover most users needs is the [[/Leo|Leo SEM]]. It is a very reliable and rugged instrument that provides high quality images of most samples. Due to its robustness new users only need a mandatory two hour training session before they are free to use it by themselves.
before they are free to use it by themselves.


The [[/Leo|Leo SEM]] is a standard instrument with a field emission gun and 3 high vacuum detectors, the Se2, Inlens and RBSD. A Röntec


==[[/FEI | FEI SEM]] - ''FEI Nova 600 NanoSEM'' ==
==[[/FEI | FEI SEM]] - ''FEI Nova 600 NanoSEM'' ==

Revision as of 17:06, 24 November 2007

The Scanning Electron Microscopes at Danchip

At the moment we have three SEM's. Together they cover a wide range of needs in the cleanroom: From the fast in-process verification of different process parameters such as etch rates, step coverages or lift-off quality to the ultra high resolution images on any type of sample intended for publication.

The SEM that will cover most users needs is the Leo SEM. It is a very reliable and rugged instrument that provides high quality images of most samples. Due to its robustness new users only need a mandatory two hour training session before they are free to use it by themselves.

The Leo SEM is a standard instrument with a field emission gun and 3 high vacuum detectors, the Se2, Inlens and RBSD. A Röntec

FEI SEM - FEI Nova 600 NanoSEM

Leo SEM - Leo 1550

Jeol SEM - Jeol JSM 5500 LV

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