Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions
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The [[/Zeiss|Zeiss SEM]] is the newest SEM in the cleanroom. It's a state-of-the-art SEM that will produce excellent images on almost any sample. Operated by the same user interface as the Leo, it is quite straight forward to change between the two instruments. | The [[/Zeiss|Zeiss SEM]] is the newest SEM in the cleanroom. It's a state-of-the-art SEM that will produce excellent images on almost any sample. Operated by the same user interface as the Leo, it is quite straight forward to change between the two instruments. | ||
The [[/FEI|FEI SEM]] | The [[/FEI|FEI SEM]] is a versatile microscope with two vacuum modes (High Vacuum and Low Vacuum) and 6 different detectors, offering excellent resolution on any type of sample or material including graphene and carbon nanotubes. Somewhat more fragile compared to the robust Leo, it is our intention that only users with special needs (for instance thick polymers, glass substrates or EDX/micromanipulator experiments) that will be trained. | ||
Outside the cleanroom in the basement of building 347, the [[/Jeol|Jeol SEM]] provides a possibilty of imaging samples that do not go into the cleanroom. | Outside the cleanroom in the basement of building 347, the [[/Jeol|Jeol SEM]] provides a possibilty of imaging samples that do not go into the cleanroom. | ||