Specific Process Knowledge/Characterization/Four-Point Probe: Difference between revisions

@@ Line 39: / Line 39: @@
 | style="background:LightGrey; color:black"|Substrate material allowed
 |style="background:WhiteSmoke; color:black"|
-*Silicon wafers (new from the box or RCA cleaned)
+*Silicon wafers
 |-
 |}