Specific Process Knowledge/Thermal Process/A1 Bor Drive-in furnace: Difference between revisions

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==A1 Furnace Bor drive-in==
==A1 Furnace Bor drive-in==
[[Image:A1.JPG|thumb|300x300px|A1 Boron drive-in furnace: positioned in cleanroom 2]]
[[Image:A1.JPG|thumb|300x300px|A1 Bor drive-in furnace: positioned in cleanroom 2]]


The A1 Furnace Bor drive-in is a Tempress horizontal furnace for oxidation of silicon wafers, annealing of the grown oxide, drive-in of boron after a pre-deposition and oxidation of the boron phase layer. Bor pre-deposition takes place in the A2 Furnace Bor pre-dep. The A1 furnace can also be used for drive in of boron which has been ion implanted.  
The A1 Furnace Bor drive-in is a Tempress horizontal furnace for oxidation of silicon wafers, annealing of the grown oxide, drive-in of boron after a pre-deposition and oxidation of the boron phase layer. Bor pre-deposition takes place in the A2 Furnace Bor pre-dep. The A1 furnace can also be used for drive in of boron which has been ion implanted.  

Revision as of 09:00, 29 November 2012

A1 Furnace Bor drive-in

A1 Bor drive-in furnace: positioned in cleanroom 2

The A1 Furnace Bor drive-in is a Tempress horizontal furnace for oxidation of silicon wafers, annealing of the grown oxide, drive-in of boron after a pre-deposition and oxidation of the boron phase layer. Bor pre-deposition takes place in the A2 Furnace Bor pre-dep. The A1 furnace can also be used for drive in of boron which has been ion implanted.

A1 is the top furnace tube in the A-stack positioned in cleanroom 2. The A-stack together with the C2 Furnace Gate oxide are the cleanest of all furnaces in the cleanroom. Please be aware of which substrates that are allowed to enter this furnace. Check the cross contamination chart.

The user manual, quality control procedure and results, technical information and contact information can be found in LabManager:

A1 Furnace: Bor Drive-in

Process knowledge


Overview of the performance of the boron drive-in furnace and some process related parameters

Purpose
  • Drive-in of boron
  • Oxidation of silicon
  • Oxidation of boron phase layer
  • Annealing of the oxide
Oxidation:
  • Dry
  • Wet: with torch (H2+O2)
Performance Film thickness
  • Dry SiO2: 50 Å to ~2000 Å (takes too long to make it thicker)
  • Wet SiO2: 50 Å to ~3 µm (takes too long to make it thicker)
Process parameter range Process Temperature
  • 800-1150 oC
Process pressure
  • 1 atm
Gasses on the system
  • O2, H2 and N2
Substrates Batch size
  • 1-30 4" wafer (or 2" wafers) per run
Substrate material allowed
  • Silicon wafers (new or RCA cleaned wafers)
  • From A2 furnace directly (e.g. incl. Predep HF)