Specific Process Knowledge/Characterization/Four-Point Probe: Difference between revisions
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==4-Point Probe== | ==4-Point Probe== | ||
The 4-Point Probe is used to make I/V measurement for resistance and resistivity measurement. But can also be used to find thickness of thin layers or test if is a N- or P-type wafer. | The 4-Point Probe is used to make I/V measurement for resistance and resistivity measurement. But can also be used to find thickness of thin layers or test if is a N- or P-type wafer. | ||
[[Image:4pointprobe.jpg|thumb|300x300px|Four point probe: positioned in cleanroom 4]] | [[Image:4pointprobe.jpg|thumb|300x300px|Four point probe: positioned in cleanroom 4]] | ||
Revision as of 09:12, 29 November 2012
4-Point Probe
The 4-Point Probe is used to make I/V measurement for resistance and resistivity measurement. But can also be used to find thickness of thin layers or test if is a N- or P-type wafer.
The user manual,technical information and contact information can be found in LabManager: