Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions

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== Technical specifcations ==
== Technical specifcations ==
=Sample requirements=
*The Nova NanoSEM analyzes a variety of samples, however, excluded are samples that may degas, disintegrate or produce dust/particles. Therefore, no wet polymers, powders etc. If you have any questions, please ask Jonas.
= Sample sizes=
*Up to 6" wafers.
= SEM modes =
* Mode 1: High Resolution SEM mode: This is the standard operation mode associated with SEM.
* Mode 2: Ultra High Resolution SEM mode: Magnetic fields generated in the chamber act as a virtual lens that engulfes the sample. Using this semi-immersion lens increased resolution may be achieved at high magnifications.
* Mode 3: EDX mode: Similar to Mode 1, but the electrons are trapped using a magnetic field.
= Lateral resolution=
The resolution that may be achieve is highly dependent on the type of sample and SEM operator skills. In the best cases one may expect:
* High Vacuum operation:
1.0 nm at 15 kV (TLD detector and optimum working distance)
1.8 nm at 1 kV (TLD detector and optimum working distance)
* Low Vacuum operation
1.5 nm at 10 kV (Helix detector and optimum working distance)
1.8 nm at 3 kV (Helix detector and optimum working distance)
= Acceleration voltage=
* 200 V - 30 kV
= Detectors=
* ETD: In chamber SE Detector (Everhardt Thornley Detector)
* TLD: Inlens SE detector (Through Lens Detector)
* BSED: BackScatter Electron Detector
* LVD: Low Vacuum SE Detector
* Helix: High resolution Low Vacuum detector
* GAD: Low Vacuum Backscatter Electron Detector (Gaseous Analytical Detector)
* EDX: Liquid nitrogen cooled detector of X-rays
= Stage=
The eucentric stage is centered in (x=0,y=0) and has eucentric point at WD 5 mm.
* X range: 150 mm
* Y range: 150 mm
* Z range: 10 mm
* Rotation: 360±
* Tilt range: -10 to 60 degrees.
= Vent and pumpdown time=
* Approximately 5 minutes combined.
= Accuracy and reproducibility=
* A standardization procedure will be introduced soon.
= Energy Dispersive X-ray analysis=
*Oxford Inca system installed for high performance EDX analysis.
= Micromanipulator=
*A Kleindiek micromanipulator with a Capres 4 point probe is installed.
==LEO SEM==
==JEOL SEM==

Revision as of 19:50, 22 November 2007

At the moment we have three SEM's.

FEI SEM

Technical specifcations

Sample requirements

  • The Nova NanoSEM analyzes a variety of samples, however, excluded are samples that may degas, disintegrate or produce dust/particles. Therefore, no wet polymers, powders etc. If you have any questions, please ask Jonas.

Sample sizes

  • Up to 6" wafers.

SEM modes

  • Mode 1: High Resolution SEM mode: This is the standard operation mode associated with SEM.
  • Mode 2: Ultra High Resolution SEM mode: Magnetic fields generated in the chamber act as a virtual lens that engulfes the sample. Using this semi-immersion lens increased resolution may be achieved at high magnifications.
  • Mode 3: EDX mode: Similar to Mode 1, but the electrons are trapped using a magnetic field.

Lateral resolution

The resolution that may be achieve is highly dependent on the type of sample and SEM operator skills. In the best cases one may expect:

  • High Vacuum operation:
1.0 nm at 15 kV (TLD detector and optimum working distance)
1.8 nm at 1 kV (TLD detector and optimum working distance)
  • Low Vacuum operation
1.5 nm at 10 kV (Helix detector and optimum working distance)
1.8 nm at 3 kV (Helix detector and optimum working distance)

Acceleration voltage

  • 200 V - 30 kV

Detectors

  • ETD: In chamber SE Detector (Everhardt Thornley Detector)
  • TLD: Inlens SE detector (Through Lens Detector)
  • BSED: BackScatter Electron Detector
  • LVD: Low Vacuum SE Detector
  • Helix: High resolution Low Vacuum detector
  • GAD: Low Vacuum Backscatter Electron Detector (Gaseous Analytical Detector)
  • EDX: Liquid nitrogen cooled detector of X-rays

Stage

The eucentric stage is centered in (x=0,y=0) and has eucentric point at WD 5 mm.

  • X range: 150 mm
  • Y range: 150 mm
  • Z range: 10 mm
  • Rotation: 360±
  • Tilt range: -10 to 60 degrees.

Vent and pumpdown time

  • Approximately 5 minutes combined.

Accuracy and reproducibility

  • A standardization procedure will be introduced soon.

Energy Dispersive X-ray analysis

  • Oxford Inca system installed for high performance EDX analysis.

Micromanipulator

  • A Kleindiek micromanipulator with a Capres 4 point probe is installed.

LEO SEM

JEOL SEM