Specific Process Knowledge/Etch/ASE (Advanced Silicon Etch): Difference between revisions
Line 22: | Line 22: | ||
|style="background:LightGrey; color:black"|Dry etch of | |style="background:LightGrey; color:black"|Dry etch of | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*Silicon | * Silicon | ||
* Polymers such as polyimide, PDMS, PMMA, BCB and resists | |||
|- | |- | ||
!style="background:silver; color:black" align="left" valign="top" rowspan="2"|Performance | !style="background:silver; color:black" align="left" valign="top" rowspan="2"|Performance | ||
Line 40: | Line 41: | ||
|style="background:LightGrey; color:black"|Gas flows | |style="background:LightGrey; color:black"|Gas flows | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*SF< | *SF<sub>_6</sub>: 0-600 sccm | ||
*O< | *O<sub>_2</sub>: 0-100 sccm | ||
*C< | *C<sub>_4</sub>F<sub>_8</sub>: 0-300 sccm | ||
*Ar: 0-100 sccm | *Ar: 0-100 sccm | ||
|- | |- |
Revision as of 10:31, 10 December 2012
The ASE
The ICP-DRIE (Inductively Coupled Plasma - Deep Reactive Ion Etcher) tool at Danchip is manufactured by STS and is called the ASE (Advanced Silicon Etcher). Originally the main purpose of the ASE was etching of silicon using the Bosch process. However, after the acquisition of the DRIE-Pegasus the ASE now only serves as backup silicon dry etcher. It has therefore been decided to diversify the etching possibilities on the ASE by adding a CO2 gas line in order to open up for polymer etching.
The Bosch process: Etching of silicon
The Bosch process uses alternation between an etch cycle and a passivation cycle. Introducing a passivation step in an etch process is very beneficial for the control of the angle of the sidewalls in the etch process because it allows us to cover them with a protective layer that suppresses the isotropic etching. Combined with the high plasma density in the ICP chamber, the excellent sidewall control enables us to etch high aspect ratio structures in silicon with very high etch rates.
In the case of the silicon etching on the ASE, an etch phase with SF6 and O2 alternates with a passivation phase with C4F8.
Process information
Purpose | Dry etch of |
|
---|---|---|
Performance | Etch rates |
|
Anisotropy |
| |
Process parameter range | Process pressure |
|
Gas flows |
| |
Substrates | Batch size |
|
Substrate material allowed |
| |
Possible masking material |
|