Specific Process Knowledge/Characterization: Difference between revisions
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*[[/SEM: Scanning Electron Microscopy|SEM JEOL]] | *[[/SEM: Scanning Electron Microscopy|SEM JEOL]] | ||
*[[/SEM: Scanning Electron Microscopy|SEM Zeiss]] | *[[/SEM: Scanning Electron Microscopy|SEM Zeiss]] | ||
*[[/AFM: Atomic Force Microscopy|Nanoman - ''Atomic Force Microscopy'']] | *[[/AFM: Atomic Force Microscopy|Nanoman - ''Atomic Force Microscopy'']] | ||
*[[/Profiler#Optical_Profiler_(Sensofar)|Optical Profiler (Sensofar)]] | *[[/Profiler#Optical_Profiler_(Sensofar)|Optical Profiler (Sensofar)]] | ||
*[[/Profiler#Dektak XTA_new stylus profiler|Dektak XTA_new]] | *[[/Profiler#Dektak XTA_new stylus profiler|Dektak XTA_new]] | ||
*[[/Profiler#Dektak _8 stylus _profiler|Dektak 8 stylus profiler]] | *[[/Profiler#Dektak _8 stylus _profiler|Dektak 8 stylus profiler]] | ||
*[[/Optical microscope|Optical microscope]] | *[[/Optical microscope|Optical microscope]] | ||
*[[/Optical characterization#Ellipsometer|Ellipsometer]] | *[[/Optical characterization#Ellipsometer|Ellipsometer]] | ||
*[[/Optical characterization#Filmtek_4000|Filmtek 4000]] | *[[/Optical characterization#Filmtek_4000|Filmtek 4000]] | ||
*[[/Optical characterization#Prism_Coupler|Prism Coupler]] | *[[/Optical characterization#Prism_Coupler|Prism Coupler]] | ||
*[[Specific_Process_Knowledge/III-V_Process/characterisation/PL_Mapper|Photoluminescence Mapper]] | *[[Specific_Process_Knowledge/III-V_Process/characterisation/PL_Mapper|Photoluminescence Mapper]] | ||
*[[/SIMS: Secondary Ion Mass Spectrometry#Atomika_SIMS|Atomika SIMS]] | *[[/SIMS: Secondary Ion Mass Spectrometry#Atomika_SIMS|Atomika SIMS]] | ||
*[[/XPS#XPS-ThermoScientific|XPS-ThermoScientific ]] | *[[/XPS#XPS-ThermoScientific|XPS-ThermoScientific ]] | ||
*[[/Drop Shape Analyzer|Drop Shape Analyzer]] | *[[/Drop Shape Analyzer|Drop Shape Analyzer]] | ||
*[[/4-Point Probe|4-Point Probe]] | *[[/4-Point Probe|4-Point Probe]] | ||
*[[/Thickness Measurer|Thickness Measurer]] | *[[/Thickness Measurer|Thickness Measurer]] | ||
*[[/Probe station|Probe station]] | *[[/Probe station|Probe station]] | ||