Specific Process Knowledge/Characterization/Profiler/Optical Profiler (Sensofar) acceptance test: Difference between revisions
| Line 191: | Line 191: | ||
*VSI Z scan 18.0µm | *VSI Z scan 18.0µm | ||
*Threshold 2% | *Threshold 2% | ||
'''See the result here:''' | '''See the result here:''' | ||