Specific Process Knowledge/Etch/Etching of Silicon Nitride: Difference between revisions

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==Comparison of wet Silicon Nitride etch and RIE etch for etching of Silicon Nitride==
==Comparison of wet Silicon Nitride etch and RIE etch for etching of Silicon Nitride==
{| border="1" cellspacing="0" cellpadding="3" align="center"
{| border="1" cellspacing="0" cellpadding="4" align="center"
!  
!  
! Wet Silicon Nitride etch
! Wet Silicon Nitride etch
! Buffered HF (BHF)
! RIE
! RIE
|-  
|-  
| What is it good for:
| General description
|
|
*Isotropic etch
*Isotropic etch
*Well suited for removing all nitride on a wafer surface (nitride strip) without a mask. High selectivity Si3N4/Si (>100) and Si3N4/SiO2 (>20) @ 180 C.
*Well suited for removing all nitride on a wafer surface (nitride strip) without a mask. High selectivity Si3N4/Si (>100) and Si3N4/SiO2 (>20) @ 180 C.
|
*Isotropic etch
*Well suited for removing all  PECVD nitride on a wafer surface (nitride strip) without a mask. Etches LPCVD nitride very slowly
|
|
*Anisotropic etch: vertical sidewalls
*Anisotropic etch: vertical sidewalls
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*Silicon Oxide
*Silicon Oxide
*PolySilicon
*PolySilicon
|
*Photoresist
*PolySilicon
*Blue film
|
|
*Photoresist
*Photoresist
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*Stoichiometric Silicon Nitride @ 180 <sup>o</sup>C: ~84 Å/min
*Stoichiometric Silicon Nitride @ 180 <sup>o</sup>C: ~84 Å/min
*Stoichiometric Silicon Nitride @ 160 <sup>o</sup>C: ~60 Å/min
*Stoichiometric Silicon Nitride @ 160 <sup>o</sup>C: ~60 Å/min
|
*PECVD nitride: ~400-1000 Å/min
|
|
*Typically 40-50 nm/min can be increased or decreased by using other recipe parameters.   
*Typically 40-50 nm/min can be increased or decreased by using other recipe parameters.   
|-
|-
|Process volume
|Batch size
|
*1-25 wafers at a time
|
|
*25 wafers at a time
*1-25 wafers at a time
|
|
*1 wafer at a time
*1 wafer at a time
|-
|-
|Size of substrate
|Size of substrate
|
*4" wafers
|
|
*4" wafers
*4" wafers
|
|
*4" wafers or smaller pieces
*4" wafers or smaller pieces
|-
|Allowed materials
|
*Silicon
*Silicon Oxide
*Silicon Nitride
*Silicon Oxynitride
|
*Silicon
*Silicon Oxide
*Silicon Nitride
*Silicon Oxynitride
*Photoresist
*Blue film
|
|-
|-
|}
|}

Revision as of 16:17, 19 November 2007

Silicon nitride can be etched using either wet chemistry or dry etch equipment. Wet chemistry is mainly used to remove all the nitride on the surface (backside and frontside) of a wafer. Dry etching etches one side at a time and can be used to etch structures with several masking materials.

Comparison of wet Silicon Nitride etch and RIE etch for etching of Silicon Nitride

Wet Silicon Nitride etch Buffered HF (BHF) RIE
General description
  • Isotropic etch
  • Well suited for removing all nitride on a wafer surface (nitride strip) without a mask. High selectivity Si3N4/Si (>100) and Si3N4/SiO2 (>20) @ 180 C.
  • Isotropic etch
  • Well suited for removing all PECVD nitride on a wafer surface (nitride strip) without a mask. Etches LPCVD nitride very slowly
  • Anisotropic etch: vertical sidewalls
Possible masking materials:
  • Silicon Oxide
  • PolySilicon
  • Photoresist
  • PolySilicon
  • Blue film
  • Photoresist
  • Silicon Oxide
  • Aluminium
  • Chromium (ONLY RIE2!)
Etch rate
  • Stoichiometric Silicon Nitride @ 180 oC: ~84 Å/min
  • Stoichiometric Silicon Nitride @ 160 oC: ~60 Å/min
  • PECVD nitride: ~400-1000 Å/min
  • Typically 40-50 nm/min can be increased or decreased by using other recipe parameters.
Batch size
  • 1-25 wafers at a time
  • 1-25 wafers at a time
  • 1 wafer at a time
Size of substrate
  • 4" wafers
  • 4" wafers
  • 4" wafers or smaller pieces
Allowed materials
  • Silicon
  • Silicon Oxide
  • Silicon Nitride
  • Silicon Oxynitride
  • Silicon
  • Silicon Oxide
  • Silicon Nitride
  • Silicon Oxynitride
  • Photoresist
  • Blue film