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Specific Process Knowledge/Characterization/Profiler/Optical Profiler (Sensofar) acceptance test: Difference between revisions

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===Results of acceptance test no. 4===
===Results of acceptance test no. 4===
Sample material: Patterned fused silica  
Sample material: Patterned fused silica.
Measurement: Depth of pattern
Measurement: Depth of pattern
Acceptance criteria:Depth 400±2 nm
Acceptance criteria:Depth within ±1% from a standard profiler measurement and repeatability (3 successive measurements) within 0.1%
Standard profiler measurement: