Specific Process Knowledge/Characterization/Profiler/Optical Profiler (Sensofar) acceptance test: Difference between revisions

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 #With Interferometric objective 50X DI: [[Media: Sensofar_A1_vsi_50xDI_SNR_with_increased_gain_and_contrast.pdf|See the results here
 ]]
+====Setting for no. 1====
+Recipe: Trench
+*Operation mode: trench
+**+ Raw smoothing confocal
+**+ fine shift
+*Objective: EPI 100X-N
+*Z scan
+**Dual - bottom up
+***top: 8µm
+***Gap: 91µm
+***Bottom: 8µm
+**Speed factor: 1x
+**+ Linear stage
+*Threshold: 0.0%
+*Light source
+**Levels: 2
+***900 -> 60
+***Gain: default