Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300/IBE process trends: Difference between revisions

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|not significantly effected by
|not significantly effected by
|Beam voltage
|Beam voltage
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==Rotation speed==
The rotation is activated to get a good uniformity over the wafer. The minimum number of rotation to get a good uniformity is 100 rotation for the hole etch. the maximum rotation speed is 20rpm. That means that an etch shorter that 5min cannot obtain a very good uniformity.
{| border="2" cellspacing="2" cellpadding="3"
!Etch Length [min]
!5
!6
!7
!8
!9
!10
!15
!20
!25
!34
!50
!100
|-
|Minimum rotation speed [rpm]
|20
|17
|15
|13
|12
|10
|7
|5
|4
|3
|2
|1
|-
|-

Revision as of 11:01, 31 July 2012

Some general process trends

This page is supposed to gather some general process trends and good advise for designing IBE recipes.

Etch rate

Etch rate Parameters
increases with Beam current
increases with Beam voltage
increases with Beam current * Beam voltage
not significantly effected by Stage angle
not significantly effected by Accelerator voltage

Etch profile

Rotation speed

The rotation is activated to get a good uniformity over the wafer. The minimum number of rotation to get a good uniformity is 100 rotation for the hole etch. the maximum rotation speed is 20rpm. That means that an etch shorter that 5min cannot obtain a very good uniformity.

Etch profile (goal 90dg) Parameters
improves with Low stage angle (optimum around 5-10 dg)
is effected by Beam current (low I(B)(400mA) better than high I(B)(600mA))
is effected by Accelerator voltage * Stage angle
not significantly effected by Beam voltage
Etch Length [min] 5 6 7 8 9 10 15 20 25 34 50 100
Minimum rotation speed [rpm] 20 17 15 13 12 10 7 5 4 3 2 1