Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300/Etch slow: Difference between revisions

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Revision as of 10:48, 31 July 2012

Etch slow

This process development is going on to find an etch recipe that is so gentle that the resist masking material can be removed with acetone + ultrasound within hopefully 10min. This is important when a metal is to be etched as this cannot withstand plasma ashing (to remove reist mask) after the etch.

Parameter Si etch first try
Neutalizer current [mA] 450
RF Power [W] 1200
Beam current [mA] 400
Beam voltage [V] 400
Beam accelerator voltage 400
Ar flow to neutralizer [sccm] 6.0
Ar flow to beam [sccm] 6.0
Rotation speed [rpm] 20
Stage angle [degrees] 10
Platen temp. [dg. Celcius] 15
He cooling pressure [mTorr] 37.5
Results vvv
etch time [min] 40
Etch rate in Si [nm/min] 19.7
Total time in Acetone + ultrasound [min] 17
Was the resist completely removed after acetone + ultrasound? no