Specific Process Knowledge/Characterization/Topographic measurement: Difference between revisions
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|'''Max. scan range xy''' | |'''Max. scan range xy''' | ||
|Line scan x: 50µm to 200mm | |Line scan x: 50µm to 200mm | ||
| | |Depending on objective: | ||
*One view: 127µmX95µm ->1270µmX955µm | |||
*Stitching: In principel a hole 6" wafer (time consuming) | |||
|90 µm square | |90 µm square | ||
|-valign="top" | |-valign="top" | ||
|'''Max. scan range z''' | |'''Max. scan range z''' | ||
|50Å to 262µm | |50Å to 262µm | ||
| | |Depending on objective and Z resolution: | ||
*94.4µm ->9984µm | |||
|1 µm (can go up to 5 µm under special settings) | |1 µm (can go up to 5 µm under special settings) | ||
|-valign="top" | |-valign="top" | ||
|'''Resolution xy''' | |'''Resolution xy''' | ||
|down to 0.067 µm | |down to 0.067 µm | ||
| | |Depending on objective: | ||
*0.5µm -> 5µm | |||
|Depending on scan size and number of samples per line and number of lines - accuracy better than 2% | |Depending on scan size and number of samples per line and number of lines - accuracy better than 2% | ||
|-valign="top" | |-valign="top" | ||
|'''Resolution z''' | |'''Resolution z''' | ||
|1Å, 10Å or 20Å | |1Å, 10Å or 20Å | ||
| | |Depending on measuring methode: | ||
*PSI down to 0.01 nm | |||
*VSI down to 1 nm | |||
*Confocal (depending on objective): 1nm -> 50nm | |||
|<1Å - accuracy better than 2% | |<1Å - accuracy better than 2% | ||
|- valign="top" | |- valign="top" | ||
|'''Max. scan depth [µm] (as a function of trench width W''') | |'''Max. scan depth [µm] (as a function of trench width W''') | ||
|1.2(W[µm]-5µm) | |1.2(W[µm]-5µm) | ||
| | |Depending on materila and trench width: | ||
*Somewhere between 1:1 and 1:12 | |||
|~1 with standard cantilever. | |~1 with standard cantilever. | ||
|-valign="top" | |-valign="top" | ||
|'''Tip radius''' | |'''Tip radius''' | ||
|5 µm 45<sup>o</sup> cone | |5 µm 45<sup>o</sup> cone | ||
| | |No tip - using light | ||
*Blue monochromatic LED: 460nm | |||
*White broadband LED: 550nm | |||
|<12 nm on standard cantilever | |<12 nm on standard cantilever | ||
|-valign="top" | |-valign="top" | ||
|'''Stress measurement''' | |'''Stress measurement''' | ||
|Can be done | |Can be done | ||
| | |No stress calculation capability | ||
|Cannot be done | |Cannot be done | ||
|-valign="top" | |-valign="top" | ||
|'''Surface roughness''' | |'''Surface roughness''' | ||
|Can be done on a line scan | |Can be done on a line scan | ||
| | |Can be done on a line or an area | ||
|Can be done on a selected surface area | |Can be done on a selected surface area | ||
|- | |- | ||
|} | |} | ||