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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions

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Jehan (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, NLAB-Nlab307-labadviser-users-34891, Bureaucrats, danchip, Administrators
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!style="background:silver; color:black" align="left"|Software - free
!style="background:silver; color:black" align="left"|Software - free
|style="background:LightGrey; color:black"|For visualation and analysis of AFM and Optical profiler files (Nanoman and Sensofar)
|style="background:LightGrey; color:black"|For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar)
|style="background:WhiteSmoke; color:black"|[http://gwyddion.net Gwyddion]"
|style="background:WhiteSmoke; color:black"|[http://gwyddion.net Gwyddion]"
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