Specific Process Knowledge/Characterization/PL mapper: Difference between revisions
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*Spot size: Approx. 100 µm at ~1000 nm. | *Spot size: Approx. 100 µm at ~1000 nm. | ||
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!style="background:silver; color:black" align="left" rowspan="2" valign="top" |Materials | |!style="background:silver; color:black" align="left" rowspan="2" valign="top" |Materials | ||
|style="background:LightGrey; color:black"|Allowed substrate materials | |style="background:LightGrey; color:black"|Allowed substrate materials | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||