Specific Process Knowledge/Lithography/Aligners/MAvsMLA: Difference between revisions
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====Linewidth and sidewall angle vs defocus parameter (AZ 5214E)==== | ====Linewidth and sidewall angle vs defocus parameter (AZ 5214E)==== | ||
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'''Result of image analysis of SEM images of 2µm triplets:''' | '''Result of image analysis of SEM images of 2µm triplets:''' | ||