Specific Process Knowledge/Lithography/Aligners/MAvsMLA: Difference between revisions
Appearance
| Line 41: | Line 41: | ||
100mJ/cm<sup>2</sup>, vacuum contact | 100mJ/cm<sup>2</sup>, vacuum contact | ||
| | | | ||
|[[W14 MA62 5214E vac D100_B4T_01.jpg|350px]] | |[[Image:W14 MA62 5214E vac D100_B4T_01.jpg|350px]] | ||
| | | | ||
|[[W14 MA62 5214E vac D100_B4T_02.jpg|350px]] | |[[Image:W14 MA62 5214E vac D100_B4T_02.jpg|350px]] | ||
|[[W14 MA62 5214E vac D100_B4T_03.jpg|350px]] | |[[Image:W14 MA62 5214E vac D100_B4T_03.jpg|350px]] | ||
|- | |- | ||
| Line 51: | Line 51: | ||
100mJ/cm<sup>2</sup>, vacuum contact | 100mJ/cm<sup>2</sup>, vacuum contact | ||
(probably over-exposed) | (probably over-exposed) | ||
|[[W32 PFL 5214 D100 vac C6B_02.jpg|350px]] | |[[Image:W32 PFL 5214 D100 vac C6B_02.jpg|350px]] | ||
|[[W32 PFL 5214 D100 vac C6B_01.jpg|350px]] | |[[Image:W32 PFL 5214 D100 vac C6B_01.jpg|350px]] | ||
|[[W32 PFL 5214 D100 vac C6B_03.jpg|350px]] | |[[Image:W32 PFL 5214 D100 vac C6B_03.jpg|350px]] | ||
|[[W32 PFL 5214 D100 vac C6B_04.jpg|350px]] | |[[Image:W32 PFL 5214 D100 vac C6B_04.jpg|350px]] | ||
|[[W32 PFL 5214 D100 vac C6B_05.jpg|350px]] | |[[Image:W32 PFL 5214 D100 vac C6B_05.jpg|350px]] | ||
|- | |- | ||
| Line 62: | Line 62: | ||
90mJ/cm<sup>2</sup>, defoc 2 | 90mJ/cm<sup>2</sup>, defoc 2 | ||
| | | | ||
|[[W13 mla2 5214E D90 F2_05.jpg|350px]] | |[[Image:W13 mla2 5214E D90 F2_05.jpg|350px]] | ||
| | | | ||
|[[W13 mla2 5214E D90 F2_01.jpg|350px]] | |[[Image:W13 mla2 5214E D90 F2_01.jpg|350px]] | ||
|[[W13 mla2 5214E D90 F2_02.jpg|350px]] | |[[Image:W13 mla2 5214E D90 F2_02.jpg|350px]] | ||
|} | |} | ||
Revision as of 13:22, 15 June 2026
The content on this page, including all images and pictures, was created by DTU Nanolab staff, unless otherwise stated.
Feedback to this page: click here
Mask Aligner vs Maskless Aligner
Slides presented at NNUM in Uppsala 2026: MA6 vs MLA 2026_v09
Mask design used in the investigation: LithoTestAlign_2025_v10.gds
Additional data
THIS PAGE IS UNDER CONSTRUCTION
AZ 5214E
Resolution
- Table with optimal parameters and resolution for different aligners
- SEM pictures
Yield
The yield is measured by inspecting all 116 lithographic resolution test structures in an optical microscope and recording the smallest resolved dots and lines.
Effect of exposure mode for mask aligner
Effect of WEC pressure for mask aligner (after WEC head service)
Resist profile (linewidth and sidewall angle)
- SEM pictures to support graphs?
| Blue circles: Width of 2µm line. Orange Squares: Sidewall angle. |
AZ MiR 701
Resolution
- Table with optimal parameters and resolution for different aligners
- SEM pictures
Resist profile (sidewall angle and linewidth)
- SEM pictures to support graphs?

Blue circles: Exposed on Aligner: MA6-2 in vacuum contact.
Orange Squares: Exposed on Aligner: Maskless 02 (MLA2) using defoc 2 (QC defoc=2).

Blue circles: Exposed on Aligner: MA6-2 in vacuum contact.
Orange Squares: Exposed on Aligner: Maskless 02 (MLA2) using defoc 2 (QC defoc=2).

Blue circles: Width of 2µm line. Orange Squares: Sidewall angle.
AZ nLOF 2020
Resolution
- Table with optimal parameters and resolution for different aligners
- SEM pictures
Resist profile (sidewall angle and linewidth)
- SEM pictures to support graphs?

Blue circles: Exposed on Aligner: MA6-2 in vacuum contact.
Orange Squares: Exposed on Aligner: Maskless 01 (MLA1) using defoc -4 (QC defoc=-2).
Grey triangles: Exposed on Aligner: Maskless 02 (MLA2) using defoc 0 (QC defoc=2).

Blue circles: Exposed on Aligner: MA6-2 in vacuum contact.
Orange Squares: Exposed on Aligner: Maskless 01 (MLA1) using defoc -4 (QC defoc=-2).
Grey triangles: Exposed on Aligner: Maskless 02 (MLA2) using defoc 0 (QC defoc=2).

Blue circles: Width of 2µm line. Orange Squares: Sidewall angle.

Blue circles: Width of 2µm line. Orange Squares: Sidewall angle.