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Specific Process Knowledge/Lithography/Aligners/MAvsMLA: Difference between revisions

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===Yield===
===Yield===
* Wafer maps of:
The yield is measured by inspecting all 116 lithographic resolution structures in an optical microscope and recording the smallest resolved dots and lines.
** Aligner: Maskless 02 (MLA2)
** Aligner: MA6-1
** Aligner: MA6-2 before service
** Aligner: MA6-2 after service + WEC pressure
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